Global EMC Experts To Convene At EMC Japan/APEMC Okinawa
Joint Symposium Takes Place at Okinawa Convention Center May 20 to 24, 2024
The 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa) is the second Asia-Pacific EMC Symposium (APEMC) to be held in Japan, following the International EMC Symposium held in Sapporo in 2019. The inaugural EMC Japan was held in Tokyo in 1984 and was the first IEEE EMC symposium to be convened outside the United States. Held jointly with IECE (currently IEICE: Institute of Electronics, Information, and Communication Engineers), the EMC Japan series has subsequently met every five years in the respective cities of Nagoya, Sendai, Kyoto, and Sapporo. ETS-Lindgren’s EMC experts will contribute to the Symposium Technical Program by organizing and presenting in three Workshops and two Paper Sessions. The company will also support the exhibition as a Symposium Sponsor.
Regarding the Technical Program, ETS-Lindgren’s contributions begin on Monday, May 20, with the paper “Accelerated EMC Site Validation Testing From 30 MHz to 200 MHz With a Reduced Number of Measurement Heights Using the Matrix Pencil Method,” presented by Zhong Chen (ETS-Lindgren USA). This paper, co-authored by Yibo Wang (ETS-Lindgren USA), describes the use of a matrix pencil method to post-process the vector s21 response data acquired during EMC site validation measurements.
On Wednesday, May 22, Mr. Chen will also present as an Invited Speaker in the “Reverberation Chambers: RC You There!” Workshop. His presentation is titled “Gaining Insights into Chamber Statistics: A Physics-Based Plane Wave Model Approach.”
ETS-Lindgren-organized Workshops begin on Thursday, May 23, with the popular “Novel EMC Measurement Test Techniques: Advances in EMC Site Validation in ANSC C63 Standards.” Workshop Co-Chairs Mr. Chen and Ikubun Kamikata (ETS-Lindgren Japan) have created an interactive session to encourage dialogue with the attendees about emerging test techniques in development by the American National Standards Committee (ANSC) C63 (EMC) and under consideration by the Comité International Spécial des Perturbations Radioélectriques (CISPR) A Committee. As active technical contributors to ANSC C63, speakers Nicholas Abbondante (Intertek USA), Working Group Chair of the C63.25 standard series for EMC test site validation, and Mr. Chen, Vice Chair of ANSC C63, are pleased to share the latest developments.
Also on May 23, Workshop Co-Chairs Janet O'Neil (ETS-Lindgren USA) and Goh Furukawa (ETS-Lindgren Japan) will preside over “Update on Automotive EMC Design and Test Methodologies for Modern Connected and Electric Vehicles.” Workshop speakers include Andy Chung (ETS-Lindgren Taiwan), who will present “Effective Test Methods to Validate EMC Performance of Electric and Hybrid Vehicles,” and Mr. Chen, who will present “Chamber Design Considerations for EMC and Antenna Pattern Measurements for Full Vehicles.” Rounding out the Workshop agenda, speakers Flavia Grassi (Politecnico di Milano Italy), Jens Medler (Rohde & Schwarz Germany), and Patrick Hansmann (AVL Austria) will provide a European perspective on this emerging topic of global importance.
In the Paper Session on May 23, Joel Kellogg (ETS-Lindgren USA) will present “Novel Comprehensive Resilience Strategy for Modern Substations.” With the paper’s co-authors Eric Easton and Ryan Marietta (CenterPoint Energy USA), Mr. Kellogg describes a unique approach to utilities that provides comprehensive substation protection not only from cyber-attacks, high-power electromagnetic pulse, intentional electromagnetic interference, and other malicious events, but also from small-arms ballistics, wind, floods, and fire.
On Friday, May 24, Workshop Co-Chairs Andrew Shyne (Boeing USA) and Ms. O'Neil will moderate “Innovative Wireless Test Methodologies for 5G New Radio and mmWave Applications.” Workshop speakers include Peter Huang (ETS-Lindgren Taiwan), who will present “Modern Chamber Environments for Testing of Wireless Devices.” Speakers Mr. Shyne, Jason Bommer (ANSYS USA), and William Koerner (Keysight Technologies USA) will contribute to this Workshop agenda with complementary presentations.
“Our speakers on the Technical Program showcase ETS-Lindgren’s contributions to many industries, including automotive, wireless, and utilities. Moreover, we share our commitment to improving measurement techniques through our leadership in the industry standards committees,” said Ms. O’Neil. “In Okinawa, we’ve assembled our global ‘A Team’ from ETS-Lindgren facilities based in the USA, Taiwan, and Japan. It’s personally a pleasure for me to spend time with these accomplished experts in person at this Symposium. I hope you take advantage of visiting with them, too, by attending their presentations or coming by our Booth #22. We would enjoy speaking with you about your test and measurement challenges, as I’m confident we have Solutions for them,” she added.
During the exhibition, visitors are encouraged to stop by Booth #22 Tuesday, May 21, to Thursday, May 23, from 10:00 am to 6:00 pm; and Friday, May 24, from 10:00 am to 12:40 pm, to talk with our Global Experts, who will collaborate with you to find cutting-edge Solutions comprised of our latest Products and Services. We’ll also have Automotive, Wireless, and our comprehensive Testand Measurement Solutions Full-Line Brochures available for attendees to take home.
Following the Symposium in Okinawa, ETS-Lindgren joins the IEEE EMC Society Japan/Sendai Chapter and the IEICE EMC Japan to host the half-day “Innovative EMC and Antenna Measurement Techniques Workshop” on Tuesday afternoon, May 28, at FUJIFILM Business Innovation Corp. in Tokyo. Invited Speakers include Mr. Chen and Mr. Abbondante, who will provide a CISPR A and ANSC C63 overview on site validation measurements from 18 GHz to 40 GHz. A highlight of the Workshop will be the Live Demonstration of measurements from 18 GHz to 40 GHz using the cylindrical mode filtered SVSWR technique in the semi-anechoic chamber at FUJIFILM. As a bonus to the Technical Program, Mr. Shyne will present on innovative antenna measurements using dual robots. The Workshop is open to all IEEE/IEICE members and guests. There is no fee to attend, but seating is limited and advance registration is required. Click here for more information, including directions to the meeting location, the registration link to secure your space, the presentation titles with abstracts, and the speaker biographies.
Click here for more information on the Joint EMC Japan/APEMC Symposium. To contact ETS-Lindgren facilities in Asia, see our “Locations” page (https://www.ets-lindgren.com/about-us/our-locations).
Source: ETS-Lindgren